Bragg X-ray Reflection

Constructive interference when 2d·sin(θ) = nλ

d-spacing (Å): 2.50
λ (Å): 1.54
θ (°): 18.0
Order n: 1

Bragg's law (1913): constructive reflection occurs when the path difference 2d·sin(θ) equals an integer multiple nλ of the wavelength. This is the foundation of X-ray crystallography — by measuring diffraction angles, one can determine atomic spacings in crystals to sub-ångström precision.